Robustness of digital approach to mismatch compensation in analog circuits realized in nanometer technologies
Zbigniew Jaworski , Piotr Wysokiński
AbstractIn this papers, a fully differential operational transconductance amplifier (OTA) implemented in 65 nm CMOS technology is analyzed to determine which component of the calibration circuitry is most susceptible to manufacturing process disturbances and thus impairs robustness of the calibration methodology. The average offset voltage of the OTA can be significantly reduced. It has been shown that effectiveness of the calibration methodology is limited by the offset voltage of the comparator that calculates sign of the OTA offset voltage.
|Book||Szczepański Paweł, Kisiel Ryszard, Romaniuk Ryszard (eds.): Proceedings of SPIE Electron Technology Conference 2013, vol. 1, no. 8902, 2013, P.O.Box 10, Bellingham, Washington 98227-0010 USA, SPIE, ISBN 9780819495211, 752 p., DOI:10.1117/12.2033297|
|Keywords in English||Mismatch compensation, analog circuits, nanometr technology|
|Score|| = 10.0, BookChapterMatConfByIndicator|
= 15.0, BookChapterMatConfByIndicator
|Publication indicators||= 5; = 0; = 6.0|
|Citation count*||6 (2020-05-14)|
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.