Electron Technology - Elte 2013

Paweł Szczepański , Ryszard Kisiel , Ryszard Romaniuk


The paper presents a digest of chosen research and technical work results shown by researchers from technical universities, governmental institutes and research firms during the XIth Scientific Conference on Electron Technology ELTE 2013. ELTE Conference has been held every three years since more than three decades. The ELTE 2013 conference was held in Ryn Castle (Poland) on 16-20 April 2013 and gathered around 270 scientists, theoreticians, technologists and engineers from such areas as material engineering, chemistry, sensors, integrated circuits, electronics engineering, laser industry, photonics, etc. The conference featured the following major four topical sessions – Micro and Nano, Photonics, Materials and Technologies, and Microsystems; two dedicated sessions – a keynote plenary session on hot topics in electron technology, as well as a session on large research projects and grants realized by the relevant community. Oral topical sessions were accompanied by poster sessions. The paper is a succinct topical introduction to the volume of ELTE 2013 proceedings. Over 100 papers, gathered in the volume, present a very relevant cross section and state-of-the-art of this branch of science and technology in Poland with involved international co-operation.
Author Paweł Szczepański (FEIT / MO)
Paweł Szczepański,,
- The Institute of Microelectronics and Optoelectronics
, Ryszard Kisiel (FEIT / MO)
Ryszard Kisiel,,
- The Institute of Microelectronics and Optoelectronics
, Ryszard Romaniuk (FEIT / PE)
Ryszard Romaniuk,,
- The Institute of Electronic Systems
Publication size in sheets0.5
Book Szczepański Paweł, Kisiel Ryszard, Romaniuk Ryszard (eds.): Proceedings of SPIE Electron Technology Conference 2013, vol. 1, no. 8902, 2013, P.O.Box 10, Bellingham, Washington 98227-0010 USA, SPIE, ISBN 9780819495211, 752 p., DOI:10.1117/12.2033297
Keywords in Englishelectron technology, electronic materials, photonic materials, electronic components, interated circuits, advanced electronic systems, optical fibers, optoelectonics, photonics, spectroscopy, electronic and photonic metrology, measurement mtehods, measurement systems, Moore's Law, More Moore, Mpre than Moore, VLSI, MEMS, MOEMS, microsystems, photonic integrted circuits, QCL, quantum cascade lasers, nano-materials, graphene, FinFET, VeSFET, VeSTIC, 3D design of electronics
URL http://spie.org/x648.xml?product_id=2033297
Languageen angielski
8902_138.pdf 266.98 KB
Score (nominal)15
Score sourceconferenceIndex
ScoreMinisterial score = 10.0, 16-06-2020, BookChapterMatConfByIndicator
Ministerial score (2013-2016) = 15.0, 16-06-2020, BookChapterMatConfByIndicator
Publication indicators WoS Citations = 0; Scopus Citations = 0; GS Citations = 2.0
Citation count*2 (2020-09-17)
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