Low-noise epitaxial graphene on SiC Hall effect element for commercial applications

T. Ciuk , Oleg Petruk , Andrzej Kowalik , Iwona Jóźwik , Jan Szmidt , Andrzej Rychter , Włodzimierz Strupiński

Abstract

n/a
Author T. Ciuk - [Instytutu Technologii Materialow Elektronicznych w Warszawie]
T. Ciuk,,
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, Oleg Petruk - [Przemyslowy Instytut Automatyki i Pomiarow, Warsaw]
Oleg Petruk,,
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, Andrzej Kowalik - [Instytutu Technologii Materialow Elektronicznych w Warszawie]
Andrzej Kowalik,,
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, Iwona Jóźwik - [Instytutu Technologii Materialow Elektronicznych w Warszawie]
Iwona Jóźwik,,
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, Jan Szmidt (FEIT / MO)
Jan Szmidt,,
- The Institute of Microelectronics and Optoelectronics
, Andrzej Rychter (FEIT / IRMT)
Andrzej Rychter,,
- The Institute of Radioelectronics and Multimedia Technology
, Włodzimierz Strupiński - [Institute of Electronic Materials Technology (ITME)]
Włodzimierz Strupiński,,
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- Instytut Technologii Materiałów Elektronicznych
Journal seriesApplied Physics Letters, ISSN 0003-6951
Issue year2016
Vol108
No223504
Pages1-6
Publication size in sheets0.5
ASJC Classification3101 Physics and Astronomy (miscellaneous)
DOIDOI:10.1063/1.4953258
ProjectModern methods of analysis and designing units and radioelectronic systems, medical electronics and measuring systems. Project leader: Modelski Józef, , Phone: +48 22 234 7233, +48 22 8256555, start date 27-04-2015, end date 30-11-2016, IRiTM/2015/15, Completed
WEiTI Działalność statutowa
Languageen angielski
LicenseJournal (articles only); author's original; Other open licence; after publication
Score (nominal)40
Score sourcejournalList
ScoreMinisterial score = 35.0, 20-02-2020, ArticleFromJournal
Ministerial score (2013-2016) = 40.0, 20-02-2020, ArticleFromJournal
Publication indicators WoS Citations = 8; Scopus Citations = 8; GS Citations = 12.0; Scopus SNIP (Source Normalised Impact per Paper): 2016 = 1.266; WoS Impact Factor: 2016 = 3.411 (2) - 2016=3.341 (5)
Citation count*12 (2020-09-17)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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