Concept and current status of data acquisition technique for GEM detector-based SXR diagnostics

Andrzej Wojeński , Krzysztof Poźniak , Grzegorz Henryk Kasprowicz , Wojciech Zabołotny , Adrian Byszuk , Paweł Zienkiewicz , M. Chernyshova , Tomasz Czarski

Abstract

This work refers to the measurement system for soft-X-ray radiation (SXR) diagnostics using gaseous electron multiplier (GEM) detectors. In terms of tokamak plasma parameter control and optimization, it is important to determine the level of SXR generated by plasma. This work describes the whole system including the GEM detector, electronic modules, and data acquisition (DAQ) path. The structure of the DAQ system is presented in terms of hardware, firmware, and software architecture. The currently developed hardware allows sampling of the GEM detector signals with 125-MHz frequency and real-time field-programmable gate array (FPGA) processing. It enables processing of all events generated by the highest possible photon flux for the GEM detector. The developed FPGA firmware registers digitized GEM detector signals with a global trigger up to 625 kHz with all 64 channels sampling simultaneously and stores them in the local memory. Therefore, it makes it possible to obtain the photon energy spectra at high photon flux (105 to 106 counts • mm-2 • s-1) in online acquisition mode. The software block performs a DAQ system start-up configuration and provides the user interface. The first preliminary results of laboratory tests are also presented.
Author Andrzej Wojeński ISE
Andrzej Wojeński,,
- The Institute of Electronic Systems
, Krzysztof Poźniak ISE
Krzysztof Poźniak,,
- The Institute of Electronic Systems
, Grzegorz Henryk Kasprowicz ISE
Grzegorz Henryk Kasprowicz,,
- The Institute of Electronic Systems
, Wojciech Zabołotny ISE
Wojciech Zabołotny,,
- The Institute of Electronic Systems
, Adrian Byszuk ISE
Adrian Byszuk,,
- The Institute of Electronic Systems
, Paweł Zienkiewicz ISE
Paweł Zienkiewicz,,
- The Institute of Electronic Systems
, M. Chernyshova
M. Chernyshova,,
-
, Tomasz Czarski
Tomasz Czarski,,
-
Journal seriesFusion Science and Technology, ISSN 1536-1055
Issue year2016
Vol69
No3
Pages595-604
Publication size in sheets0.5
Keywords in EnglishFPGA data processing; GEM detector; Soft X-ray plasma diagnostics
DOIDOI:10.13182/FST15-189
URL http://www.ans.org/pubs/journals/fst/a_38357
Languageen angielski
Score (nominal)20
ScoreMinisterial score = 20.0, 27-03-2017, ArticleFromJournal
Ministerial score (2013-2016) = 20.0, 27-03-2017, ArticleFromJournal
Publication indicators WoS Impact Factor: 2016 = 0.578 (2) - 2016=0.528 (5)
Citation count*10 (2018-02-24)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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