Concept and current status of data acquisition technique for GEM detector-based SXR diagnostics

Andrzej Wojeński , Krzysztof Poźniak , Grzegorz Henryk Kasprowicz , Wojciech Zabołotny , Adrian Byszuk , Paweł Zienkiewicz , M. Chernyshova , Tomasz Czarski


This work refers to the measurement system for soft-X-ray radiation (SXR) diagnostics using gaseous electron multiplier (GEM) detectors. In terms of tokamak plasma parameter control and optimization, it is important to determine the level of SXR generated by plasma. This work describes the whole system including the GEM detector, electronic modules, and data acquisition (DAQ) path. The structure of the DAQ system is presented in terms of hardware, firmware, and software architecture. The currently developed hardware allows sampling of the GEM detector signals with 125-MHz frequency and real-time field-programmable gate array (FPGA) processing. It enables processing of all events generated by the highest possible photon flux for the GEM detector. The developed FPGA firmware registers digitized GEM detector signals with a global trigger up to 625 kHz with all 64 channels sampling simultaneously and stores them in the local memory. Therefore, it makes it possible to obtain the photon energy spectra at high photon flux (105 to 106 counts • mm-2 • s-1) in online acquisition mode. The software block performs a DAQ system start-up configuration and provides the user interface. The first preliminary results of laboratory tests are also presented.
Author Andrzej Wojeński (FEIT / PE)
Andrzej Wojeński,,
- The Institute of Electronic Systems
, Krzysztof Poźniak (FEIT / PE)
Krzysztof Poźniak,,
- The Institute of Electronic Systems
, Grzegorz Henryk Kasprowicz (FEIT / PE)
Grzegorz Henryk Kasprowicz,,
- The Institute of Electronic Systems
, Wojciech Zabołotny (FEIT / PE)
Wojciech Zabołotny,,
- The Institute of Electronic Systems
, Adrian Byszuk (FEIT / PE)
Adrian Byszuk,,
- The Institute of Electronic Systems
, Paweł Zienkiewicz (FEIT / PE)
Paweł Zienkiewicz,,
- The Institute of Electronic Systems
, M. Chernyshova - [Instytut Problemow Jadrowyc]
M. Chernyshova,,
, Tomasz Czarski - [Instytut Problemow Jadrowyc]
Tomasz Czarski,,
Journal seriesFusion Science and Technology, ISSN 1536-1055
Issue year2016
Publication size in sheets0.5
Keywords in EnglishFPGA data processing; GEM detector; Soft X-ray plasma diagnostics
ASJC Classification2210 Mechanical Engineering; 2500 General Materials Science; 2104 Nuclear Energy and Engineering; 3106 Nuclear and High Energy Physics; 2205 Civil and Structural Engineering
Languageen angielski
Score (nominal)20
Score sourcejournalList
ScoreMinisterial score = 20.0, 15-06-2020, ArticleFromJournal
Ministerial score (2013-2016) = 20.0, 15-06-2020, ArticleFromJournal
Publication indicators WoS Citations = 10; Scopus Citations = 11; GS Citations = 18.0; Scopus SNIP (Source Normalised Impact per Paper): 2016 = 0.688; WoS Impact Factor: 2016 = 0.578 (2) - 2016=0.528 (5)
Citation count*18 (2020-09-15)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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