Pomiary losowości danych wytwarzanych przez generator wbudowany w procesory firmy Intel z rodziny Ivy Bridge

Paweł Jan Czernik , Wiesław Winiecki

Abstract

n/a
Author Paweł Jan Czernik (FEIT / RE)
Paweł Jan Czernik,,
- The Institute of Radioelectronics
, Wiesław Winiecki (FEIT / RE)
Wiesław Winiecki,,
- The Institute of Radioelectronics
Pages99-100
Publication size in sheets0.3
Book Adamczak Stanisław (eds.): VI Kongres Metrologii, 2013, Kielce-Sandomierz, Politechnika Świętokrzyska, ISBN 9788363792404, 368 p.
Languagepl polski
Score (nominal)0
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