Pomiary losowości danych wytwarzanych przez generator wbudowany w procesory firmy Intel z rodziny Ivy Bridge

Paweł Jan Czernik , Wiesław Winiecki

Abstract

n/a
Author Paweł Jan Czernik (FEIT / RE)
Paweł Jan Czernik,,
- The Institute of Radioelectronics
, Wiesław Winiecki (FEIT / RE)
Wiesław Winiecki,,
- The Institute of Radioelectronics
Journal seriesMeasurement Automation Monitoring, [Pomiary Automatyka Kontrola], ISSN 2450-2855, [0032-4140]
Issue year2013
Vol59
No5
Pages402-405
Publication size in sheets0.5
Languagepl polski
LicenseJournal (articles only); author's original; Other open licence; after publication
File
pub 52I.pdf 447.31 KB
Score (nominal)11
ScoreMinisterial score = 7.0, 04-09-2019, ArticleFromJournal
Ministerial score (2013-2016) = 11.0, 04-09-2019, ArticleFromJournal
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