Complex conductivity of YBCO films in normal and superconducting states probed by microwave measurements

Jerzy Krupka , J. Wosik , Cezariusz Jastrzębski , Tymoteusz Ciuk , J Mazierska , Mariusz Zdrojek


We report on microwave frequency characterization of yttrium barium copper oxide (YBCO) thin films in both normal and superconducting states. A microwave single-post dielectric resonator technique using two different resonators was used for the complex conductivity determination of YBCO samples deposited on dielectric substrates. The intrinsic complex conductivity of YBCO films was determined from the measured resonator quality factor $Q$ and resonant frequency values employing rigorous electromagnetic modeling of the resonant structures with the mode-matching and Rayleigh-Ritz techniques. Such approach allowed us to determine the intrinsic properties of the films (conductivity, permittivity, and penetration depth) without any simplifications and errors associated with approximate modeling employing perturbation theory. We describe the superconducting material only through its intrinsic material properties, such as the complex conductivity, which does not depend on the thickness of the sample and other parameters. From both simulations and experimental results, we show that the proposed method of intrinsic complex conductivity determination is particularly useful for the characterization of very thin YBCO layers. To support the novelty of our approach, it is shown that significant differences appear between the rigorous and perturbation computations for thin superconducting films (below 50 nm). © 2011 IEEE.
Author Jerzy Krupka (FEIT / MO)
Jerzy Krupka,,
- The Institute of Microelectronics and Optoelectronics
, J. Wosik - [University of Houston]
J. Wosik,,
, Cezariusz Jastrzębski (FP / SRD)
Cezariusz Jastrzębski,,
- Structural Research Division
, Tymoteusz Ciuk (FEIT / MO)
Tymoteusz Ciuk,,
- The Institute of Microelectronics and Optoelectronics
, J Mazierska - [James Cook University, Australia]
J Mazierska,,
, Mariusz Zdrojek (FP / SRD)
Mariusz Zdrojek,,
- Structural Research Division
Journal seriesIEEE Transactions on Applied Superconductivity, ISSN 1051-8223
Issue year2013
Keywords in EnglishApproximate modeling; Complex conductivity; Dielectric resonator technique; Dielectric substrates; Electromagnetic modeling; Frequency characterization; Intrinsic property; Material property; Microwave conductivity; Mode matching; Perturbation theory; Rayleigh-ritz; Resonant structures; Resonator quality; Significant differences; Superconducting state; Thin superconducting films; Two fluid model; YBCO film; YBCO layer, Barium compounds; Dielectric devices; Natural frequencies; Superconducting films; Superconducting materials; Superconductivity; Yttrium; Yttrium barium copper oxides, Microwave resonators
ASJC Classification2208 Electrical and Electronic Engineering; 3104 Condensed Matter Physics; 2504 Electronic, Optical and Magnetic Materials
Languageen angielski
Score (nominal)25
Score sourcejournalList
ScoreMinisterial score = 25.0, 29-09-2020, ArticleFromJournal
Ministerial score (2013-2016) = 25.0, 29-09-2020, ArticleFromJournal
Publication indicators Scopus Citations = 12; WoS Citations = 12; GS Citations = 15.0; Scopus SNIP (Source Normalised Impact per Paper): 2013 = 1.16; WoS Impact Factor: 2013 = 1.324 (2) - 2013=1.122 (5)
Citation count*15 (2020-09-27)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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