Dielectric characterization of low-loss materials a comparison of techniques
J Baker-Jarvis , R Geyer , Jr. Grosvenor , M.D. Janezic , C.A. Jones , B Riddle , C.M. Weil , Jerzy Krupka
AbstractMeasurements on low-loss materials using closed and open cavity resonators, and dielectric resonator methods are presented. Results indicate that consistent measurement results can be obtained with a number of well-characterized fixtures. Uncertainties associated with each method are addressed. Measurements also were performed on materials used in previous intercomparisons
|Journal series||IEEE Transactions on Dielectrics and Electrical Insulation, ISSN 1070-9878|
|Keywords in English||air gaps, Anisotropic magnetoresistance, cavity resonators, closed cavity resonators, Crystalline materials, dielectric characterization, dielectric materials, dielectric measurement, dielectric measurements, dielectric resonator methods, dielectric resonators, Electric variables measurement, fixtures, frequency, low-loss materials, measurement errors, measurement uncertainties, open cavity resonators, permittivity measurement, Polarization|
|Publication indicators||: 2006 = 0.771 (2) - 2007=0.994 (5)|
|Citation count*||126 (2015-08-04)|
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.