Dielectric characterization of low-loss materials a comparison of techniques

J Baker-Jarvis , R Geyer , Jr. Grosvenor , M.D. Janezic , C.A. Jones , B Riddle , C.M. Weil , Jerzy Krupka

Abstract

Measurements on low-loss materials using closed and open cavity resonators, and dielectric resonator methods are presented. Results indicate that consistent measurement results can be obtained with a number of well-characterized fixtures. Uncertainties associated with each method are addressed. Measurements also were performed on materials used in previous intercomparisons
Author J Baker-Jarvis
J Baker-Jarvis,,
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, R Geyer
R Geyer,,
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, Jr. Grosvenor
Jr. Grosvenor,,
-
, M.D. Janezic
M.D. Janezic,,
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, C.A. Jones
C.A. Jones,,
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, B Riddle
B Riddle,,
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, C.M. Weil
C.M. Weil,,
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, Jerzy Krupka IMiO
Jerzy Krupka,,
- The Institute of Microelectronics and Optoelectronics
Journal seriesIEEE Transactions on Dielectrics and Electrical Insulation, ISSN 1070-9878
Issue year1998
Vol5
No4
Pages571-577
Keywords in Englishair gaps, Anisotropic magnetoresistance, cavity resonators, closed cavity resonators, Crystalline materials, dielectric characterization, dielectric materials, dielectric measurement, dielectric measurements, dielectric resonator methods, dielectric resonators, Electric variables measurement, fixtures, frequency, low-loss materials, measurement errors, measurement uncertainties, open cavity resonators, permittivity measurement, Polarization
DOIDOI:10.1109/94.708274
Score (nominal)30
Publication indicators WoS Impact Factor [Impact Factor WoS]: 2006 = 0.771 (2) - 2007=0.994 (5)
Citation count*126 (2015-08-04)
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