Improvement of accuracy in measurements of the surface resistance of superconductors using dielectric resonators

Jerzy Krupka , J Mazierska

Abstract

Two techniques to minimize the influence of parasitic losses on surface resistance measurements of superconductors employing dielectric resonators have been described. The first method optimizes the sapphire resonator aspect ratio to minimize the parasitic losses for given superconductor sample dimensions and measurement frequency. The second utilizes a reference resonator with a perfect conductor plane to cancel out the influence of parasitic losses by measurements of the resonant frequencies and Q-factors of two resonators. The second technique is recommended when materials having noticeable dielectric losses are used to construct dielectric resonators
Author Jerzy Krupka IMiO
Jerzy Krupka,,
- The Institute of Microelectronics and Optoelectronics
, J Mazierska
J Mazierska,,
-
Journal seriesIEEE Transactions on Applied Superconductivity, ISSN 1051-8223
Issue year1998
Vol8
No4
Pages164-167
Keywords in EnglishAl2O3, aspect ratio, Conducting materials, dielectric losses, dielectric loss measurement, dielectric measurements, dielectric resonator, dielectric resonators, Electrical resistance measurement, electric resistance measurement, frequency measurement, Loss measurement, microwave measurement, optimization methods, parasitic loss, Q-factor, reference resonator, resonant frequency, sapphire resonator, Superconducting materials, superconductivity, superconductor, surface conductivity, surface resistance, surface resistance measurement
DOIDOI:10.1109/77.740681
Score (nominal)25
Publication indicators WoS Impact Factor: 2006 = 0.717 (2) - 2007=1.191 (5)
Citation count*9 (2015-08-04)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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