High-Q sapphire-rutile frequency-temperature compensated microwave dielectric resonators
M.E. Tobar , Jerzy Krupka , J.G. Hartnett , E.N. Ivanov , R.A. Woode
AbstractA sapphiro-rutile composite resonator was constructed from a cylindrical sapphire monocrystal with two thin disks of monocrystal rutile held tightly against the ends. Because rutile exhibits low loss and an opposite temperature coefficient of permittivity to sapphire, it is an ideal material for compensating the frequency-temperature dependence of a sapphire resonator. Most of the electromagnetic modes in the composite structure exhibited turning points (or compensation points) in the frequency-temperature characteristic. The temperatures of compensation for the WG quasi TM modes were measured to be below 90 K with Q-factors of the order of a few million depending on the mode. For WG quasi TE modes, the temperatures of compensation were measured to be between 100 to 160 K with Q-factors of the order of a few hundreds of thousands, depending on the mode. The second derivatives of the compensation points were measured to be of the order 0.1 ppm/K/sup 2/, which agreed well with the predicted values.
|Journal series||IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control, ISSN 0885-3010|
|Keywords in English||Al/sub 2/O/sub 3/-TiO/sub 2/, Building Materials, compensation, compensation point, Crystalline materials, dielectric materials, dielectric measurements, dielectric resonators, electromagnetic mode, frequency-temperature compensation, loss, microwave dielectric resonator, microwave frequencies, monocrystal, permittivity, Q factor, Q-factor, sapphire, sapphire-rutile composite resonator, Tellurium, temperature coefficient of permittivity, temperature dependence, titanium compounds, turning, turning point, WG quasi TE mode, WG quasi TM mode|
|Publication indicators||: 2006 = 1.729 (2) - 2007=1.81 (5)|
|Citation count*||43 (2015-08-04)|
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.