Surface resistance and morphology of YBCO films as a function of thickness

F.J.B. Stork , K.A. Beall , A. Roshko , D.C. DeGroot , D.A. Rudman , R Ono , Jerzy Krupka


We have examined the thickness dependence of the growth morphology and surface resistance Rs of laser ablated YBa2Cu 3O7-x films with transition temperatures over 89 K and critical current densities greater than 106 A/cm2 at 76 K. The thickness was varied from 50 to 1600 nm while all other deposition conditions were maintained constant. The microstructure has been characterized by scanning electron microscopy and scanning tunneling microscopy continuously decreased with film thickness as a power law with an exponent of -0.5. The surface resistance was measured at 76 K with a dielectric rod resonator. For films less than 300 nm thick, the fields penetrated the superconducting films, causing a rapid increase in the apparent Rs with decreasing film thickness. Films thicker than 800 nm showed microcracks and the Rs increased sharply, and no resonance was observed above 1000 nm
Author F.J.B. Stork
F.J.B. Stork,,
, K.A. Beall
K.A. Beall,,
, A. Roshko
A. Roshko,,
, D.C. DeGroot
D.C. DeGroot,,
, D.A. Rudman
D.A. Rudman,,
, R Ono
R Ono,,
, Jerzy Krupka (FEIT / MO)
Jerzy Krupka,,
- The Institute of Microelectronics and Optoelectronics
Journal seriesIEEE Transactions on Applied Superconductivity, ISSN 1051-8223
Issue year1997
Keywords in English50 to 1600 nm, 76 K, 89 K, barium compounds, Critical current density, critical current density (superconductivity), crystal microstructure, crystal morphology, dielectric rod resonator, field penetration, growth morphology, high-temperature superconductors, laser ablated films, laser transitions, microcracks, Microstructure, penetration depth (superconductivity), power law, scanning electron microscopy, Scanning tunneling microscopy, Scanning tunnelling microscopy, Superconducting films, superconducting thin films, Superconducting transition temperature, surface conductivity, surface emitting lasers, surface morphology, surface resistance, temperature dependence, thickness dependence, Transition temperature, YBa2Cu3O7, YBa2Cu3O7-x, Yttrium barium copper oxide, yttrium compounds
ASJC Classification2208 Electrical and Electronic Engineering; 3104 Condensed Matter Physics; 2504 Electronic, Optical and Magnetic Materials
Score (nominal)25
Score sourcejournalList
Publication indicators WoS Citations = 21; GS Citations = 29.0; Scopus SNIP (Source Normalised Impact per Paper): 1999 = 1.988; WoS Impact Factor: 2006 = 0.717 (2) - 2007=1.191 (5)
Citation count*29 (2015-08-04)
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