Detection of yield trends
Witold Pleskacz , Wojciech Maly , H.T. Heineken
AbstractThis paper proposes a yield data filtration procedure. This procedure is intended for the reduction of noise in the yield data. Such a reduction is a key step in the detection of yield trends that have to be known for yield modeling and yield analysis purposes
|Publication size in sheets||0.5|
|Book||Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - DFT 1997, 1997, IEEE, ISBN 0818681683, 314 p.|
|Keywords in English||area measurement, IC measurement, IC yield, integrated circuit measurement, Integrated circuit modeling, integrated circuit modelling, integrated circuit noise, integrated circuit yield, Loss measurement, noise reduction, production testing, Semiconductor device modeling, Testing, time measurement, Virtual manufacturing, yield analysis, yield data filtration, yield estimation, yield modeling, yield trends|
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