Detection of yield trends

Witold Pleskacz , Wojciech Maly , H.T. Heineken

Abstract

This paper proposes a yield data filtration procedure. This procedure is intended for the reduction of noise in the yield data. Such a reduction is a key step in the detection of yield trends that have to be known for yield modeling and yield analysis purposes
Author Witold Pleskacz (FEIT / MO) - [W.A. Pleskacz Dept. of Electr. & Comput. Eng., Carnegie Mellon University]
Witold Pleskacz,,
- The Institute of Microelectronics and Optoelectronics
- W.A. Pleskacz Dept. of Electr. & Comput. Eng., Carnegie Mellon University
, Wojciech Maly - [Carnegie Mellon University (CMU)]
Wojciech Maly,,
-
- Carnegie Mellon University
, H.T. Heineken - [Carnegie Mellon University]
H.T. Heineken,,
-
-
Pages62-68
Publication size in sheets0.5
Book Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - DFT 1997, 1997, IEEE, ISBN 0818681683, 314 p.
Keywords in Englisharea measurement, IC measurement, IC yield, integrated circuit measurement, Integrated circuit modeling, integrated circuit modelling, integrated circuit noise, integrated circuit yield, Loss measurement, noise reduction, production testing, Semiconductor device modeling, Testing, time measurement, Virtual manufacturing, yield analysis, yield data filtration, yield estimation, yield modeling, yield trends
DOIDOI:10.1109/DFTVS.1997.628310
URL https://ieeexplore.ieee.org/document/628310/
Languageen angielski
Score (nominal)0
Publication indicators Scopus Citations = 0; WoS Citations = 0
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