Extensive testing of floating point unit

Janusz Sosnowski , Tomasz Bech

Abstract

This paper addresses the problem of developing test programs for IEEE-754 and Intel x87-compliant floating point units (FPUs). Exhaustive testing is assured by a balanced mixture of pseudorandom, fault and application-oriented instruction sequences. Special tools have been used to manage the test monitoring and to optimize the fault coverage. Their usefulness was illustrated with experimental results. Some data related to the cost (in time and RAM space) of the developed tests are presented
Author Janusz Sosnowski (FEIT / IN)
Janusz Sosnowski,,
- The Institute of Computer Science
, Tomasz Bech (FEIT / IN)
Tomasz Bech,,
- The Institute of Computer Science
Pages180-187 vol.1
Book Euromicro Conference, 2000. Proceedings of the 26th, vol. 1, 2000
Keywords in Englishapplication-oriented instruction sequences, Arithmetic, Circuit faults, circuit testing, cost, Costs, exhaustive testing, fault coverage optimization, fault sequences, floating point arithmetic, Hardware, IEEE-754 compliant floating point units, integrated circuit testing, Intel x87-compliant floating point units, microprocessor chips, microprocessors, microprocessor testing, monitoring, observability, pseudorandom sequences, RAM space, Registers, sequences, system testing, test monitoring, test program development, Time
DOIDOI:10.1109/EURMIC.2000.874631
Languageen angielski
Score (nominal)0
Publication indicators Scopus Citations = 3; WoS Citations = 4; GS Citations = 8.0
Citation count*8 (2020-09-20)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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