Split post dielectric resonator technique for precise measurements of laminar dielectric specimens-measurement uncertainties

Jerzy Krupka , R.N. Clarke , O.C. Rochard , A.P. Gregory

Abstract

A split-post dielectric resonator was used to measure solid laminar dielectric specimens which had been previously measured by a number of other techniques. Detailed error analysis of permittivity and dielectric loss tangent measurements has been performed. It was proved that, by using a 4 GHz split post resonator, it is possible to measure permittivity with uncertainties down to 0.3\% and dielectric loss tangent with resolution 2 times;10-5 for well machined laminar specimens
Author Jerzy Krupka (FEIT / MO)
Jerzy Krupka,,
- The Institute of Microelectronics and Optoelectronics
, R.N. Clarke - [National Physical Laboratory]
R.N. Clarke,,
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, O.C. Rochard - [National Physical Laboratory]
O.C. Rochard,,
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, A.P. Gregory - [National Physical Laboratory]
A.P. Gregory,,
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Pages305-308 vol.1
Book 13th International Conference on Microwaves, Radar and Wireless Communications. 2000. MIKON-2000, vol. 1, 2000
Keywords in English3.9 GHz, Dielectric devices, dielectric losses, dielectric loss measurement, dielectric loss tangent measurements, dielectric materials, dielectric measurements, dielectric resonators, error analysis, laminar dielectric specimens, Loss measurement, measurement errors, measurement uncertainty, microwave measurement, performance evaluation, permittivity measurement, permittivity measurements, Solids, split post dielectric resonator technique
DOIDOI:10.1109/MIKON.2000.913930
Score (nominal)0
Publication indicators WoS Citations = 12; Scopus Citations = 25; GS Citations = 38.0
Citation count*38 (2020-09-06)
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