Precise microwave characterisation of materials for emerging technologies
- Janina Mazierska,
- Mohan V Jacob,
- Jerzy Krupka
Precise values of microwave parameters of materials are necessary for construction of novel microwave devices and circuits for wireless communication. To ensure accurate microwave characterization of superconducting and dielectric materials a novel measurement technique of unloaded Q-factor of microwave resonators has been developed and various types of dielectric resonators constructed. Several known and new materials including dielectrics (CaFz, LiTa03, YV03, LSAT, BaF2, Teflon, Rexolite and Polyethylene), often for the first time, and superconductors (YBazCu307 on differing substrates and doped with Ag, Tl(Ba,Sr)2Ca2Cu30y, MgB2) have been tested with a superior precision in a wide range of temperatures. This paper presents research outcomes of the Microwave Characterisation of Materials group lead by Janina Mazierska.
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- Verma A.K. A.K. Verma (eds.): 2004 Asia-Pacific Microwave Conference Proceedings, 2004, Allied Publishers Private Ltd., 1088 p., ISBN 9788177647228
- https://researchonline.jcu.edu.au/7695/ Opening in a new tab
- (en) English
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