First-Order Modeling of Errors Due to Coaxial Connector Interface

Arkadiusz Lewandowski , Leszek J. Opalski , Wojciech Wiatr , Arkadiusz Gołaszewski , Adam Abramowicz


We present an approach for first-order modeling of errors in vector-network-analyzer (VNA) measurements caused by the coaxial-connector interface. These errors result primarily from the presence of a gap in the inner conductor. Our approach relies on an approximate model of the connector interface that comprises an analytical equivalent-circuit for the inner conductor gap section and a behavioral scattering-parameter model for the socket-contact section. We verify this model using full-wave electromagnetic simulations for the 1.85, 2.4, 3.5 mm, and Type-N coaxial-connector interface for different inner conductor-gap widths. We further apply this model to asses first-order errors in VNA calibration introduced by the tolerance on the inner conductor-gap width. We show that the inner conductor-gap effect can be accounted for with a series inductance inserted at the inner conductor mating-plane while the effect of the socket contact can be lumped into the VNA calibration coefficients. We verify this error model experimentally by measuring a Type-N offset load with an adjustable inner conductor gap. We also demonstrate that including our error model in coaxial offset-short definitions leads to improved consistency of a one-port VNA calibration with 3.5-mm coaxial offset-short standards. Our results can be used in the uncertainty analysis and accuracy enhancement of VNA scattering-parameter measurements.
Author Arkadiusz Lewandowski (FEIT / PE)
Arkadiusz Lewandowski,,
- The Institute of Electronic Systems
, Leszek J. Opalski (FEIT / PE)
Leszek J. Opalski,,
- The Institute of Electronic Systems
, Wojciech Wiatr (FEIT / PE)
Wojciech Wiatr,,
- The Institute of Electronic Systems
, Arkadiusz Gołaszewski (FEIT / PE)
Arkadiusz Gołaszewski,,
- The Institute of Electronic Systems
, Adam Abramowicz (FEIT / PE)
Adam Abramowicz,,
- The Institute of Electronic Systems
Journal seriesIEEE Transactions on Microwave Theory and Techniques, ISSN 0018-9480, (N/A 140 pkt)
Issue year2019
Publication size in sheets0.6
Keywords in EnglishCalibration, coaxial connector, error modeling, inner conductor gap, vector network analyzer (VNA)
ASJC Classification2208 Electrical and Electronic Engineering; 3104 Condensed Matter Physics; 3108 Radiation
Languageen angielski
08588299.pdf 2.96 MB
Score (nominal)140
Score sourcejournalList
ScoreMinisterial score = 140.0, 18-12-2019, ArticleFromJournal
Publication indicators Scopus Citations = 0; WoS Citations = 0; Scopus SNIP (Source Normalised Impact per Paper): 2018 = 2.138; WoS Impact Factor: 2018 = 3.756 (2) - 2018=3.864 (5)
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