Determination of Bi12SiO20 permittivity and loss tangent in the 220–325 GHz band and the influence of UV exposure on these parameters

Paweł Bajurko , Konrad Godziszewski , Yevhen Yashchyshyn , D. Vynnyk , V. Haiduchok , I. Solskii

Abstract

n/a
Author Paweł Bajurko (FEIT / IRMT)
Paweł Bajurko,,
- The Institute of Radioelectronics and Multimedia Technology
, Konrad Godziszewski (FEIT / IRMT)
Konrad Godziszewski,,
- The Institute of Radioelectronics and Multimedia Technology
, Yevhen Yashchyshyn (FEIT / IRMT)
Yevhen Yashchyshyn,,
- The Institute of Radioelectronics and Multimedia Technology
, D. Vynnyk
D. Vynnyk,,
-
, V. Haiduchok
V. Haiduchok,,
-
, I. Solskii
I. Solskii,,
-
Pages576-579
Publication size in sheets0.5
Book Proc. of TCSET 2020, 2020, Institute of Electrical and Electronics Engineers, ISBN 978-1-7281-5566-1
DOIDOI:10.1109/TCSET49122.2020.235498
URL https://ieeexplore.ieee.org/document/9088668
Languageen angielski
Score (nominal)20
Score sourcepublisherList
ScoreMinisterial score = 20.0, 25-06-2020, ChapterFromConference
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