FPGA-based GEM detector signal acquisition for SXR spectroscopy system

Andrzej Wojeński , Krzysztof Poźniak , Grzegorz Henryk Kasprowicz , Piotr Kolasiński , Rafał Krawczyk , Wojciech Zabołotny , M. Chernyshova , Tomasz Czarski , Karol Malinowski


The presented work is related to the Gas Electron Multiplier (GEM) detector soft X-ray spectroscopy system for tokamak applications. The used GEM detector has one-dimensional, 128 channel readout structure. The channels are connected to the radiation-hard electronics with configurable analog stage and fast ADCs, supporting speeds of 125 MSPS for each channel. The digitalized data is sent directly to the FPGAs using fast serial links. The preprocessing algorithms are implemented in the FPGAs, with the data buffering made in the on-board 2Gb DDR3 memory chips. After the algorithmic stage, the data is sent to the Intel Xeon-based PC for further postprocessing using PCI-Express link Gen 2. For connection of multiple FPGAs, PCI-Express switch 8-to-1 was designed. The whole system can support up to 2048 analog channels. The scope of the work is an FPGA-based implementation of the recorder of the raw signal from GEM detector. Since the system will work in a very challenging environment (neutron radiation, intense electro-magnetic fields), the registered signals from the GEM detector can be corrupted. In the case of the very intense hot plasma radiation (e.g. laser generated plasma), the registered signals can overlap. Therefore, it is valuable to register the raw signals from the GEM detector with high number of events during soft X-ray radiation. The signal analysis will have the direct impact on the implementation of photon energy computation algorithms. As the result, the system will produce energy spectra and topological distribution of soft X-ray radiation. The advanced software was developed in order to perform complex system startup and monitoring of hardware units. Using the array of two one-dimensional GEM detectors it will be possible to perform tomographic reconstruction of plasma impurities radiation in the SXR region.
Author Andrzej Wojeński ISE
Andrzej Wojeński,,
- The Institute of Electronic Systems
, Krzysztof Poźniak ISE
Krzysztof Poźniak,,
- The Institute of Electronic Systems
, Grzegorz Henryk Kasprowicz ISE
Grzegorz Henryk Kasprowicz,,
- The Institute of Electronic Systems
, Piotr Kolasiński ISE
Piotr Kolasiński,,
- The Institute of Electronic Systems
, Rafał Krawczyk ISE
Rafał Krawczyk,,
- The Institute of Electronic Systems
, Wojciech Zabołotny ISE
Wojciech Zabołotny,,
- The Institute of Electronic Systems
, M. Chernyshova
M. Chernyshova,,
, Tomasz Czarski
Tomasz Czarski,,
, Karol Malinowski
Karol Malinowski,,
Journal seriesJournal of Instrumentation, ISSN 1748-0221
Issue year2016
Publication size in sheets0.5
Keywords in EnglishComputing (architecture, farms, GRID for recording, storage, archiving, and distribution of data); Modular electronics; Plasma diagnostics - charged-particle spectroscopy; Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc)
URL http://iopscience.iop.org/article/10.1088/1748-0221/11/11/C11035
Languageen angielski
Score (nominal)35
ScoreMinisterial score = 20.0, 27-03-2017, ArticleFromJournal
Ministerial score (2013-2016) = 35.0, 27-03-2017, ArticleFromJournal
Publication indicators WoS Impact Factor: 2016 = 1.22 (2) - 2016=1.297 (5)
Citation count*4 (2018-02-22)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.