A novel approach to high-sensitivity grating interferometry

Joanna Schmit , Krzysztof Patorski

Abstract

The authors propose a new approach for obtaining information about in-plane and out-of-plane displacements of an object tested using high-sensitivity grating interferometry. The interferences of each of the specimen grating diffraction orders with a reference beam are recorded separately. Computer addition and subtraction of the phase functions calculated from the interferograms give the in-plane and out-of-plane displacement values, respectively. The authors present their experimental work, and then compare their results with those obtained using a conventional grating interferometry approach.
Author Joanna Schmit
Joanna Schmit,,
-
, Krzysztof Patorski (FM / IMPh)
Krzysztof Patorski,,
- The Institute of Micromechanics and Photonics
Journal seriesOptics and Lasers in Engineering, ISSN 0143-8166
Issue year1997
Vol26
No6
Pages461-471
ASJC Classification2208 Electrical and Electronic Engineering; 2210 Mechanical Engineering; 3107 Atomic and Molecular Physics, and Optics; 2504 Electronic, Optical and Magnetic Materials
DOIDOI:10.1016/S0143-8166(96)00003-6
URL http://www.sciencedirect.com/science/article/pii/S0143816696000036
Score (nominal)30
Score sourcejournalList
Publication indicators WoS Citations = 2; GS Citations = 2.0; Scopus SNIP (Source Normalised Impact per Paper): 1999 = 0.544; WoS Impact Factor: 2006 = 0.977 (2) - 2007=0.992 (5)
Citation count*2 (2020-09-13)
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