Investigation of parameters of thin films deposited on planar waveguides

Elżbieta Auguściuk , Marcin Roszko , Wojciech Fabianowski

Abstract

n/a
Author Elżbieta Auguściuk (FP / OPD)
Elżbieta Auguściuk,,
- Optics and Photonics Division
, Marcin Roszko
Marcin Roszko,,
-
, Wojciech Fabianowski (FC / CPCT)
Wojciech Fabianowski,,
- Chair Of Polymer Chemistry And Technology
Pages168-170
Book SPIE proceedings series, vol. 4239, 2000, Society of Photo-Optical Instrumentation Engineers, ISBN 0-8194-3913-4
Keywords in EnglishCaptador óptico, Capteur optique, Deposition process, Dispositif couche mince, Dispositivo capa delgada, Epaisseur couche, Espectrometría, Espesor capa, Estudio experimental, Etude expérimentale, Experimental result, Experimental study, Fibra óptica, Fibre optique, Guía onda óptica, Guía onda plano, Guide onde optique, Guide onde plan, Imida polímero, Imide polymère, Indice refracción, Indice réfraction, Indirect method, integrated optics, Layer thickness, Material orgánico, Matériau organique, Measurement method, measuring system, Méthode indirecte, Méthode mesure, Método indirecto, Método medida, Optica integrada, optical fiber, Optical sensor, Optical waveguide, Optique intégrée, Organic material, Planar waveguide, Polyimide, Procédé dépôt, Procedimiento revestimiento, Refraction index, Resultado experimental, Résultat expérimental, Revêtement centrifugation, Sistema medida, Spectrométrie, spectrometry, Spin-on coatings, Système mesure, Thin film device
URL http://cat.inist.fr/?aModele=afficheN&cpsidt=786575
Languageen angielski
Score (nominal)3
Citation count*3 (2013-01-30)
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