Recognition and characterization of defects in GaN epilayers

Elżbieta Jezierska , J. Borysiuk

Abstract

n/a
Author Elżbieta Jezierska (FMSE / DCFM)
Elżbieta Jezierska,,
- Division of Construction and Functional Materials
, J. Borysiuk
J. Borysiuk,,
-
Journal seriesInżynieria Materiałowa, ISSN 0208-6247
Issue year2013
Vol4
Pages277-282
Languageen angielski
Score (nominal)13
ScoreMinisterial score = 7.0, 05-09-2019, ArticleFromJournal
Ministerial score (2013-2016) = 13.0, 05-09-2019, ArticleFromJournal
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