Single-shot 3 × 3 beam grating interferometry for self-imaging free extended range wave front sensing

Krzysztof Patorski , Łukasz Służewski , Maciej Trusiak

Abstract

Crossed grating 3×3 beam lateral shear interferometry for extended range wave front sensing is presented. A Fresnel diffraction pattern of two multiplicatively superimposed linear diffraction gratings each generating three diffraction orders is recorded. A simple solution employs a common crossed binary amplitude Ronchi grating with spatial filtering. Digital processing of a single-shot pattern includes separating multidirectional pairs of orthogonal lateral shear interferograms, retrieving second harmonics of their intensity distribution, and calculating shearing phases. Single-frame automatic fringe pattern processing based on the Hilbert–Huang transform is used for this purpose. Using second harmonics extends the aberration measurement range since they encode self-imaging free two-beam interferograms without contrast modulations. Experimental works corroborate the principle and capabilities of the proposed approach.
Author Krzysztof Patorski IMiF
Krzysztof Patorski,,
- The Institute of Micromechanics and Photonics
, Łukasz Służewski
Łukasz Służewski,,
-
, Maciej Trusiak IMiF
Maciej Trusiak,,
- The Institute of Micromechanics and Photonics
Journal seriesOptics Letters, ISSN 0146-9592
Issue year2016
Vol41
No18
Pages4417-4420
Publication size in sheets0.5
Keywords in EnglishInterferometry; Talbot and self-imaging effects; Diffraction and gratings
DOIDOI:10.1364/OL.41.004417
URL https://www.osapublishing.org/ol/abstract.cfm?uri=ol-41-18-4417
Languageen angielski
Score (nominal)45
ScoreMinisterial score = 35.0, 28-11-2017, ArticleFromJournal
Ministerial score (2013-2016) = 45.0, 28-11-2017, ArticleFromJournal
Publication indicators WoS Impact Factor: 2016 = 3.416 (2) - 2016=3.228 (5)
Citation count*2 (2018-02-20)
Cite
Share Share



* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
Back