Grating (Moiré) Interferometry for In-Plane Displacement and Strain Measurement of Microcomponents
Leszek Sałbut , Małgorzata Kujawińska
AbstractOptical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, grating interferometry, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts.
|Publication size in sheets||0.75|
|Book||Osten Wolfgang (eds.): Optical Inspection of Microsystems (Second Edition), 2020, London, New York, CRC Press / Balkema, ISBN 978-1-4987-7947-0, 570 p., DOI:10.1201/9780429186738|
|Score||= 20.0, 22-04-2020, MonographChapterAuthor|
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