Rough-sets-based reduction for analog systems diagnostics

Piotr Bilski , Jacek Wojciechowski

Abstract

n/a
Author Piotr Bilski (FEIT / RE)
Piotr Bilski,,
- The Institute of Radioelectronics
, Jacek Wojciechowski (FEIT / RE)
Jacek Wojciechowski,,
- The Institute of Radioelectronics
Journal seriesIEEE Transactions On Instrumentation And Measurement, (A 25 pkt)
Issue year2011
Vol60
No3
Pages880-890
ASJC Classification2208 Electrical and Electronic Engineering; 3105 Instrumentation
DOIDOI:10.1109/TIM.2010.2060225
ProjectModern methods of analysis and designing of radio-frequency, medical electronics and measuring circuits and systems. Project leader: Modelski Józef, Phone: +48 22 234 7233, +48 22 8256555, start date 06-10-2010, end date 30-11-2011, IRE/2011/DS, Completed
WEiTI Działalność statutowa
Languageen angielski
Score (nominal)25
Publication indicators WoS Citations = 10; Scopus Citations = 13; Scopus SNIP (Source Normalised Impact per Paper): 2011 = 1.704; WoS Impact Factor: 2011 = 1.214 (2) - 2011=1.175 (5)
Citation count*15 (2019-05-16)
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