Characterization of MOS structures with ultrathin insulator layer by means of a theoretical model

Bogdan Majkusiak

Abstract

n/a
Author Bogdan Majkusiak (FEIT / MO)
Bogdan Majkusiak,,
- The Institute of Microelectronics and Optoelectronics
Journal seriesElektronika- konstrukcje, technologie, zastosowania, ISSN 0033-2089, (B 6 pkt)
Issue year2011
VolLII
No3
Pages30-32
Languageen angielski
Score (nominal)6
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