Charging effects in the MOS structures with silicon nanocrystals embedded in SiO2

Bogdan Majkusiak , Andrzej Igor Mazurak , A. Kshirsagar , Jerzy Rużyłło

Abstract

n/a
Author Bogdan Majkusiak (FEIT / MO)
Bogdan Majkusiak,,
- The Institute of Microelectronics and Optoelectronics
, Andrzej Igor Mazurak (FEIT / MO)
Andrzej Igor Mazurak,,
- The Institute of Microelectronics and Optoelectronics
, A. Kshirsagar
A. Kshirsagar,,
-
, Jerzy Rużyłło
Jerzy Rużyłło,,
-
Pages81-82
Book Francisco Gamiz (eds.): EUROSOI Conference Proceedings VII Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits, 2011, Universidad de Granada, 156 p.
Languageen angielski
Score (nominal)10
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