Current Develpments in Contactless Measurements of High Quality Materials for Microelectronics and Nanotechnology employing Dielectric Resonator Techniques

Jerzy Krupka , Janina Mazierska

Abstract

n/a
Author Jerzy Krupka (FEIT / MO)
Jerzy Krupka,,
- The Institute of Microelectronics and Optoelectronics
, Janina Mazierska
Janina Mazierska,,
-
Pages1-5
Book Muis Abdul, Rizkinia Mia, Maraden Ian: Tredns and Developments in Converging Technology Towards 2020, 2011, Institute of Electrical and Electronics Engineers, Inc., 250 p.
Languageen angielski
Score (nominal)10
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