Current Develpments in Contactless Measurements of High Quality Materials for Microelectronics and Nanotechnology employing Dielectric Resonator Techniques
Jerzy Krupka , Janina Mazierska
|Book||Muis Abdul, Rizkinia Mia, Maraden Ian: Tredns and Developments in Converging Technology Towards 2020, 2011, Institute of Electrical and Electronics Engineers, Inc., 250 p.|
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