Increasing sensitivity of arc-induced long-period gratings - pushing the fabrication technique toward its limits

Mateusz Jakub Śmietana , Wojtek J. Bock , P. Mikulic

Abstract

n/a
Author Mateusz Jakub Śmietana IMiO
Mateusz Jakub Śmietana,,
- The Institute of Microelectronics and Optoelectronics
, Wojtek J. Bock
Wojtek J. Bock,,
-
, P. Mikulic
P. Mikulic,,
-
Journal seriesMeasurement Science & Technology
Issue year2011
No22
Pages1-6
DOIDOI:10.1088/0957-0233/22/1/015201
projectThe Development of Design, Processing and Testing Methods of the Electronic Devices and Materials for Microelectronics and Optoelectronics. Project leader: Szczepański Paweł, , Phone: (48 22) 234 58 70, application date 23-06-2010, start date 01-07-2010, planned end date 31-03-2011, end date 31-01-2012, IMiO/2010/STATUT/1, Completed
WEiTI Działalność statutowa
Languageen angielski
Score (nominal)35
Publication indicators WoS Impact Factor: 2011 = 1.494 (2) - 2011=1.561 (5)
Citation count*0
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