Increasing sensitivity of arc-induced long-period gratings - pushing the fabrication technique toward its limits

Mateusz Jakub Śmietana , Wojtek J. Bock , P. Mikulic


Author Mateusz Jakub Śmietana (FEIT / MO)
Mateusz Jakub Śmietana,,
- The Institute of Microelectronics and Optoelectronics
, Wojtek J. Bock - [Universite du Quebec en Outaouais]
Wojtek J. Bock,,
, P. Mikulic - [Universite du Quebec en Outaouais]
P. Mikulic,,
Journal seriesMeasurement Science & Technology, (A 35 pkt)
Issue year2011
ASJC Classification2604 Applied Mathematics; 3105 Instrumentation
ProjectThe Development of Design, Processing and Testing Methods of the Electronic Devices and Materials for Microelectronics and Optoelectronics. Project leader: Szczepański Paweł, , Phone: (48 22) 234 58 70, application date 23-06-2010, start date 01-07-2010, planned end date 31-03-2011, end date 31-01-2012, IMiO/2010/STATUT/1, Completed
WEiTI Działalność statutowa
Languageen angielski
Score (nominal)35
Score sourcejournalList
Publication indicators Scopus Citations = 71; WoS Citations = 51; Scopus SNIP (Source Normalised Impact per Paper): 2011 = 1.704; WoS Impact Factor: 2011 = 1.494 (2) - 2011=1.561 (5)
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