The effective resolution measurements in scope of sine-fit test

Konrad Hejn , Andrzej Pacut , L Kramarski

Abstract

n/a
Author Konrad Hejn ISE
Konrad Hejn,,
- The Institute of Electronic Systems
, Andrzej Pacut IAiIS
Andrzej Pacut,,
- The Institute of Control and Computation Engineering
, L Kramarski
L Kramarski,,
-
Journal seriesIEEE Transactions On Instrumentation And Measurement
Issue year1998
Vol47
No1
Pages45-50
Publication size in sheets0.5
Languageen angielski
Score (nominal)25
Publication indicators WoS Impact Factor: 2006 = 0.572 (2) - 2007=0.952 (5)
Citation count*12 (2015-04-22)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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