Complex permittivity measurements of extremely low loss dielectric materials using whispering gallery modes

Jerzy Krupka , Krzysztof Derzakowski , Adam Abramowicz , M Tabar , R.G Geyer

Abstract

Whispering-gallery modes are used for very accurate complex permittivity measurements of both isotropic and uniaxially anisotropic dielectric materials. A mode-matching technique is used to find the relationship between the complex permittivity, resonant frequency, and the dimensions of a resonant structure. The total uncertainty in permittivity is smaller than 0.05 percent and is limited principally by uncertainty in sample dimensions.
Author Jerzy Krupka (FEIT / MO)
Jerzy Krupka,,
- The Institute of Microelectronics and Optoelectronics
, Krzysztof Derzakowski (FEIT / RE)
Krzysztof Derzakowski,,
- The Institute of Radioelectronics
, Adam Abramowicz (FEIT / PE)
Adam Abramowicz,,
- The Institute of Electronic Systems
, M Tabar
M Tabar,,
-
, R.G Geyer - [Warsaw University of Technology (PW)]
R.G Geyer,,
-
- Politechnika Warszawska
Pages1347-1350
Publication size in sheets0.5
Book 1997 IEEE MTT Symposium, USA, 1997, USA
DOIDOI:10.1109/MWSYM.1997.596578
URL http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=596452
Languageen angielski
Score (nominal)0
Publication indicators WoS Citations = 12; Scopus Citations = 19; GS Citations = 29.0
Citation count*29 (2020-09-06)
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