Complex permittivity measurements of extremely low loss dielectric materials using whispering gallery modes
Jerzy Krupka , Krzysztof Derzakowski , Adam Abramowicz , M Tabar , R.G Geyer
AbstractWhispering-gallery modes are used for very accurate complex permittivity measurements of both isotropic and uniaxially anisotropic dielectric materials. A mode-matching technique is used to find the relationship between the complex permittivity, resonant frequency, and the dimensions of a resonant structure. The total uncertainty in permittivity is smaller than 0.05 percent and is limited principally by uncertainty in sample dimensions.
|Publication size in sheets||0.5|
|Book||1997 IEEE MTT Symposium, USA, 1997, USA|
|Publication indicators||= 12; = 19; = 29.0|
|Citation count*||29 (2020-09-06)|
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.