Measuring noise parameters of two-ports with spectrum analyser FSM

P Heymann , Wojciech Wiatr

Abstract

n/a
Author P Heymann
P Heymann,,
-
, Wojciech Wiatr (FEIT / PE)
Wojciech Wiatr,,
- The Institute of Electronic Systems
Journal seriesNews from Rhode-Schwartz
Issue year1997
Vol37
Pages20-23
Languageen angielski
Score (nominal)4
Citation count*
Cite
Share Share

Get link to the record


* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
Back
Confirmation
Are you sure?