New formulation for external coupling analysis and measurements

Adam Abramowicz , Krzysztof Derzakowski , Jerzy Krupka

Abstract

n/a
Author Adam Abramowicz (FEIT / PE)
Adam Abramowicz,,
- The Institute of Electronic Systems
, Krzysztof Derzakowski (FEIT / RE)
Krzysztof Derzakowski,,
- The Institute of Radioelectronics
, Jerzy Krupka (FEIT / MO)
Jerzy Krupka,,
- The Institute of Microelectronics and Optoelectronics
Pages247-249
Book 1997 Int.Conf. Electromagnetics for Advanced Applications, Italy, 1997, Italy
Languageen angielski
Score (nominal)0
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